hpc-cluster/smart-data/smart-2/WD-WCAVY0532420.txt

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abgefragt am Thu Jan 9 23:59:14 CET 2020
smartctl 7.0 2018-12-30 r4883 [x86_64-linux-5.3.0-26-generic] (local build)
Copyright (C) 2002-18, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Western Digital RE4-GP
Device Model: WDC WD2002FYPS-01U1B0
Serial Number: WD-WCAVY0532420
LU WWN Device Id: 5 0014ee 20315cda2
Firmware Version: 04.05G05
User Capacity: 2,000,398,934,016 bytes [2.00 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: 5400 rpm
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS (minor revision not indicated)
SATA Version is: SATA 2.6, 3.0 Gb/s
Local Time is: Thu Jan 9 23:59:14 2020 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (41160) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 469) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x303f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 9250
3 Spin_Up_Time 0x0027 149 149 021 Pre-fail Always - 9516
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 70
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0
9 Power_On_Hours 0x0032 001 001 000 Old_age Always - 77024
10 Spin_Retry_Count 0x0032 100 253 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 253 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 70
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 65
193 Load_Cycle_Count 0x0032 092 092 000 Old_age Always - 325911
194 Temperature_Celsius 0x0022 133 084 000 Old_age Always - 19
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 196 196 000 Old_age Always - 1460
198 Offline_Uncorrectable 0x0030 200 200 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 199 199 000 Old_age Offline - 264
SMART Error Log Version: 1
Warning: ATA error count 119 inconsistent with error log pointer 3
ATA Error Count: 119 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 119 occurred at disk power-on lifetime: 11487 hours (478 days + 15 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 80 80 20 08 40 Error: UNC at LBA = 0x00082080 = 532608
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
40 00 80 80 20 08 40 00 00:31:24.474 READ VERIFY SECTOR(S)
ef 03 46 00 00 00 00 00 00:31:05.423 SET FEATURES [Set transfer mode]
40 00 80 80 20 08 40 00 00:30:58.321 READ VERIFY SECTOR(S)
ef 03 46 00 00 00 00 00 00:30:43.285 SET FEATURES [Set transfer mode]
40 00 80 00 20 08 40 00 00:30:36.182 READ VERIFY SECTOR(S)
Error 118 occurred at disk power-on lifetime: 11487 hours (478 days + 15 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 80 80 20 08 40 Error: UNC at LBA = 0x00082080 = 532608
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
40 00 80 80 20 08 40 00 00:30:58.321 READ VERIFY SECTOR(S)
ef 03 46 00 00 00 00 00 00:30:43.285 SET FEATURES [Set transfer mode]
40 00 80 00 20 08 40 00 00:30:36.182 READ VERIFY SECTOR(S)
ef 03 46 00 00 00 00 00 00:30:17.131 SET FEATURES [Set transfer mode]
40 00 80 00 20 08 40 00 00:30:10.028 READ VERIFY SECTOR(S)
Error 117 occurred at disk power-on lifetime: 11487 hours (478 days + 15 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 80 00 20 08 40 Error: UNC at LBA = 0x00082000 = 532480
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
40 00 80 00 20 08 40 00 00:30:36.182 READ VERIFY SECTOR(S)
ef 03 46 00 00 00 00 00 00:30:17.131 SET FEATURES [Set transfer mode]
40 00 80 00 20 08 40 00 00:30:10.028 READ VERIFY SECTOR(S)
ef 03 46 00 00 00 00 00 00:29:50.977 SET FEATURES [Set transfer mode]
40 00 80 00 20 08 40 00 00:29:43.874 READ VERIFY SECTOR(S)
Error 116 occurred at disk power-on lifetime: 11487 hours (478 days + 15 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 80 00 20 08 40 Error: UNC at LBA = 0x00082000 = 532480
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
40 00 80 00 20 08 40 00 00:30:10.028 READ VERIFY SECTOR(S)
ef 03 46 00 00 00 00 00 00:29:50.977 SET FEATURES [Set transfer mode]
40 00 80 00 20 08 40 00 00:29:43.874 READ VERIFY SECTOR(S)
ef 03 46 00 00 00 00 00 00:29:24.823 SET FEATURES [Set transfer mode]
40 00 80 00 20 08 40 00 00:29:17.720 READ VERIFY SECTOR(S)
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.